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Convergent beam electron diffraction of multilayer Van der Waals structures. (2020)

First Author: Latychevskaia T

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.ultramic.2020.112976

PubMed Identifier: 32217349

Publication URI: http://europepmc.org/abstract/MED/32217349

Type: Journal Article/Review

Volume: 212

Parent Publication: Ultramicroscopy

ISSN: 0304-3991