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Bidirectional Volatile Signatures of Metal-Oxide Memristors-Part I: Characterization (2020)

First Author: Giotis C

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/ted.2020.3014854

Publication URI: http://dx.doi.org/10.1109/ted.2020.3014854

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Electron Devices

Issue: 11