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DetectorChecker: analyzing patterns of defects in detector screens (2020)

First Author: Brettschneider J

Attributed to: Inside-out: Statistical methods for Computed Tomography validation of complex structures in Additive Layer Manufacturing funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.21105/joss.02474

Publication URI: http://dx.doi.org/10.21105/joss.02474

Type: Journal Article/Review

Parent Publication: Journal of Open Source Software

Issue: 56