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Comparing Xe+ pFIB and Ga+ FIB for TEM sample preparation of Al alloys: Minimising FIB-induced artefacts. (2021)

First Author: Zhong X

Attributed to: Sir Henry Royce Institute - Manchester and NNL Equipment funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1111/jmi.12983

PubMed Identifier: 33210738

Publication URI: http://europepmc.org/abstract/MED/33210738

Type: Journal Article/Review

Volume: 282

Parent Publication: Journal of microscopy

Issue: 2

ISSN: 0022-2720