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Detectors-The ongoing revolution in scanning transmission electron microscopy and why this important to material characterization (2020)

First Author: MacLaren I

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1063/5.0026992

Publication URI: http://dx.doi.org/10.1063/5.0026992

Type: Journal Article/Review

Parent Publication: APL Materials

Issue: 11