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Application of Modern Scanning/Transmission Electron Microscope with Pixelated STEM Detector for Radiation Damage Study (2020)

First Author: Lim J

Attributed to: World Class Materials Facilities at the University of Huddersfield funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1017/s1431927620014506

Publication URI: http://dx.doi.org/10.1017/s1431927620014506

Type: Journal Article/Review

Parent Publication: Microscopy and Microanalysis

Issue: S2