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Determining the refractive index dispersion and thickness of hot-pressed chalcogenide thin films from an improved Swanepoel method (2017)

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1007/s11082-017-1057-9

Publication URI: http://dx.doi.org/10.1007/s11082-017-1057-9

Type: Journal Article/Review

Parent Publication: Optical and Quantum Electronics

Issue: 7