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Atom probe Tomography of fast-diffusing impurities and the effect of gettering in multicrystalline silicon (2018)

First Author: Tweddle D

Attributed to: University of Oxford - Equipment Account funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1063/1.5049338

Publication URI: http://dx.doi.org/10.1063/1.5049338

Type: Conference/Paper/Proceeding/Abstract