📣 Try out the NEW Gateway to Research and let us know what you think.

We're looking for users to test the new service during August and September and share their feedback. Express your interest by completing this short form.

Surface scattering and the 3D transfer characteristics of optical profilers (2020)

First Author: Coupland J

Attributed to: Synthetic aperture interferometry: High-resolution optical measurement over an exceptionally large field of view funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1117/12.2556878

Publication URI: http://dx.doi.org/10.1117/12.2556878

Type: Conference/Paper/Proceeding/Abstract