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A sub-micron resolution, bunch-by-bunch beam trajectory feedback system and its application to reducing wakefield effects in single-pass beamlines (2021)

First Author: Bett D

Attributed to: The John Adams Institute for Accelerator Science funded by STFC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1088/1748-0221/16/01/p01005

Publication URI: http://dx.doi.org/10.1088/1748-0221/16/01/p01005

Type: Journal Article/Review

Parent Publication: Journal of Instrumentation

Issue: 01