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Defect characterization of {101¯3} GaN by electron microscopy (2022)

First Author: Kusch G

Attributed to: Time-resolved cathodoluminescence scanning electron microscope funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1063/5.0077084

Publication URI: http://dx.doi.org/10.1063/5.0077084

Type: Journal Article/Review

Parent Publication: Journal of Applied Physics

Issue: 3