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Directly correlated microscopy of trench defects in InGaN quantum wells. (2021)

First Author: O'Hanlon TJ

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.ultramic.2021.113255

PubMed Identifier: 33762123

Publication URI: http://europepmc.org/abstract/MED/33762123

Type: Journal Article/Review

Volume: 231

Parent Publication: Ultramicroscopy

ISSN: 0304-3991