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Carrier dynamics at trench defects in InGaN/GaN quantum wells revealed by time-resolved cathodoluminescence. (2022)

First Author: Kusch G

Attributed to: Time-resolved cathodoluminescence scanning electron microscope funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1039/d1nr06088k

PubMed Identifier: 34919106

Publication URI: http://europepmc.org/abstract/MED/34919106

Type: Journal Article/Review

Volume: 14

Parent Publication: Nanoscale

Issue: 2

ISSN: 2040-3364