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Validating S-parameter measurements of RF integrated circuits at milli-Kelvin temperatures (2022)

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1049/ell2.12545

Publication URI: http://dx.doi.org/10.1049/ell2.12545

Type: Journal Article/Review

Parent Publication: Electronics Letters

Issue: 16