Etching of the SiGa x N y Passivation Layer for Full Emissive Lateral Facet Coverage in InGaN/GaN Core-Shell Nanowires by MOVPE (2022)
Attributed to:
Manufacturing of nano-engineered III-N semiconductors: Equipment Business Case
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1021/acs.cgd.2c00286
Publication URI: http://dx.doi.org/10.1021/acs.cgd.2c00286
Type: Journal Article/Review
Parent Publication: Crystal Growth & Design
Issue: 9