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In Situ Sputtering From the Micromanipulator to Enable Cryogenic Preparation of Specimens for Atom Probe Tomography by Focused-Ion Beam. (2023)

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1093/micmic/ozad020

PubMed Identifier: 37749683

Publication URI: http://europepmc.org/abstract/MED/37749683

Type: Journal Article/Review

Volume: 29

Parent Publication: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada

Issue: 3

ISSN: 1431-9276