Microscopic KMC Modeling of Oxide RRAMs
Attributed to:
Resistive switches (RRAM) and memristive behaviour in silicon-rich silicon oxides
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1007/978-3-030-10692-8_32
Publication URI: http://dx.doi.org/10.1007/978-3-030-10692-8_32
Type: Book Chapter
Book Title: Numerical Methods and Applications - 9th International Conference, NMA 2018, Borovets, Bulgaria, August 20-24, 2018, Revised Selected Papers (2019)
Page Reference: 290-297
ISSN: 16113349 03029743