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A Unified Computational Scheme for 3D Statistical Simulation of Reliability Degradation of Nanoscale MOSFETs (2012)

First Author: Adamu-Lema F.

Attributed to: Molecular-Metal-Oxide-nanoelectronicS (M-MOS): Achieving the Molecular Limit funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Type: Other

Parent Publication: International Conference on Simulation of Semiconductor Processes and Devices, SISPAD