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Detection Sensitivity Limit of Hundreds of Atoms with X-Ray Fluorescence Microscopy (2023)

First Author: Masteghin M

Attributed to: Route to high-precision positioning of single ion-implanted impurities in silicon funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.48550/arxiv.2310.03409

Publication URI: https://arxiv.org/abs/2310.03409

Type: Preprint