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Evidence of Improved Thermal Stability via Nanoscale Contact Engineering in IGZO Source-Gated Thin-Film Transistors (2023)

First Author: Alfarisyi S

Attributed to: The Physics and Engineering of Oxide Semiconductors for Large-Area CMOS funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.17863/cam.96641

Publication URI: https://www.repository.cam.ac.uk/handle/1810/349837

Type: Journal Article/Review