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Annealing at Different Temperatures of Silicon Microstrip Detectors After Severe Hadron Irradiation (2012)

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/tns.2012.2186316

Publication URI: http://dx.doi.org/10.1109/tns.2012.2186316

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Nuclear Science

Issue: 2

ISSN: 0018-9499