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Evaluation of radiation damaged P-in-n and N-in-n silicon microstrip detectors (1999)

First Author: Unno Y

Attributed to: Supplementary funding to support ST/H001093/2 funded by STFC

Abstract

No abstract provided

Bibliographic Information

Type: Journal Article/Review

Volume: 46

Parent Publication: IEEE TRANSACTIONS ON NUCLEAR SCIENCE

Issue: 6

ISSN: 0018-9499