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High-resolution soft x-ray spectrometry using the electron-multiplying charge-coupled device (EM-CCD) (2013)

First Author: David J. Hall And James H. Tutt And Matthew R. Soman And Andrew D. Holland And Neil J. Murray And Bernd Schmitt And Thorsten Schmitt

Abstract

No abstract provided

Bibliographic Information

Volume: 8859

Parent Publication: Proceedings of SPIE