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Microstructural characterization of the tool-chip interface enabled by focused ion beam and analytical electron microscopy (2009)

First Author: Flink A

Attributed to: Building New Capability in Structural Ceramics funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.wear.2009.03.001

Publication URI: http://dx.doi.org/10.1016/j.wear.2009.03.001

Type: Journal Article/Review

Parent Publication: Wear

Issue: 11-12