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Phase measurement through sinusoidal excitation with application to multi-wavelength interferometry (2009)

First Author: Falaggis K

Attributed to: Optimum Multi-Wavelength Interferometric Sensing: Absolute Metrology from Nanometres to 100m funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1088/1464-4258/11/5/054008

Publication URI: http://dx.doi.org/10.1088/1464-4258/11/5/054008

Type: Journal Article/Review

Parent Publication: Journal of Optics A: Pure and Applied Optics

Issue: 5