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Further development of surface metrology methods for predicting the functional performance of flexible photovoltaic barrier films (2013)

First Author: Elrawemi M

Attributed to: EPSRC Centre for Innovative Manufacturing in Advanced Metrology funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1088/2051-672x/1/1/015006

Publication URI: http://dx.doi.org/10.1088/2051-672x/1/1/015006

Type: Journal Article/Review

Parent Publication: Surface Topography: Metrology and Properties

Issue: 1