📣 Try out the NEW Gateway to Research and let us know what you think.

We're looking for users to test the new service during August and September and share their feedback. Express your interest by completing this short form.

Buffer Design to Minimize Current Collapse in GaN/AlGaN HFETs (2012)

First Author: Uren M

Attributed to: Novel Sub-Threshold Methodologies for GaN Electronic Devices: A Study of Device Reliability and Degradation Mechanisms funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/ted.2012.2216535

Publication URI: http://dx.doi.org/10.1109/ted.2012.2216535

Type: Journal Article/Review

Parent Publication: IEEE Transactions on Electron Devices

Issue: 12