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A non-contact, thermal noise based method for the calibration of lateral deflection sensitivity in atomic force microscopy. (2014)

First Author: Mullin N
Attributed to:  Low-Dimensional Chemistry funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1063/1.4901221

PubMed Identifier: 25430116

Publication URI: http://europepmc.org/abstract/MED/25430116

Type: Journal Article/Review

Volume: 85

Parent Publication: The Review of scientific instruments

Issue: 11

ISSN: 0034-6748