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Bias and light-induced electrical instability in nanocrystalline silicon thin film transistors

First Author: Nathan A

Attributed to: IKC in Advanced Manufacturing Technologies for Photonics and Electronics - Exploiting Molecular and Macromolecular Materials (MMM) funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Type: Conference/Paper/Proceeding/Abstract

Volume: NA

Parent Publication: 2011 MRS Spring Meeting & Exhibit