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Statistical distribution of RTS amplitudes in 20nm SOI FinFETs (2012)

First Author: Wang X

Attributed to: ENIAC MOdeling and DEsign of Reliable, process variation-aware Nanoelectronic devices, circuits and systems (MODERN) funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/snw.2012.6243347

Publication URI: http://dx.doi.org/10.1109/SNW.2012.6243347

Type: Conference/Paper/Proceeding/Abstract