Electron Diffraction Based Nano-Metrology
Lead Research Organisation:
University of Cambridge
Department Name: Materials Science & Metallurgy
Abstract
This project is based on the development and application of a new form of electron
microscopy, namely scanning electron diffraction (SED) microscopy, a technique in
which a fine-scale (nm-sized) electron probe is scanned across a region of interest
and electron diffraction patterns are acquired at every point in the scanned area. The
remarkably rich dataset this produces provides a wealth of crystallographic data that can
be used to determine atomic structure, the presence of defects and the local
microstructure. In particular, by carefully analysing subtle distortions in the electron diffraction pattern, one can measure a local strain tensor with nanometer spatial resolution. In this project, I wish to build on successful initial results to develop strain mapping into a true nano-metrological technique, improving the robustness and sensitivity of the strain determination and quantifying the limits of the practice."
microscopy, namely scanning electron diffraction (SED) microscopy, a technique in
which a fine-scale (nm-sized) electron probe is scanned across a region of interest
and electron diffraction patterns are acquired at every point in the scanned area. The
remarkably rich dataset this produces provides a wealth of crystallographic data that can
be used to determine atomic structure, the presence of defects and the local
microstructure. In particular, by carefully analysing subtle distortions in the electron diffraction pattern, one can measure a local strain tensor with nanometer spatial resolution. In this project, I wish to build on successful initial results to develop strain mapping into a true nano-metrological technique, improving the robustness and sensitivity of the strain determination and quantifying the limits of the practice."
People |
ORCID iD |
| Paul Midgley (Primary Supervisor) | |
| Phillip Crout (Student) |
Publications
Johnstone D
(2020)
Density-based clustering of crystal (mis)orientations and the orix Python library
in Journal of Applied Crystallography
Studentship Projects
| Project Reference | Relationship | Related To | Start | End | Student Name |
|---|---|---|---|---|---|
| EP/N509620/1 | 01/10/2016 | 30/09/2022 | |||
| 1937212 | Studentship | EP/N509620/1 | 01/10/2017 | 30/09/2021 | Phillip Crout |
| Title | Python for Electron Microscopy: pyxem, diffsims and orix |
| Description | pyxem provides an open source framework for the interpretation of S(P)ED data. This is complemented by diffsims, a TEM simulation package written in pure python and orix, an orientation data analysis package. |
| Type Of Technology | Software |
| Year Produced | 2019 |
| Open Source License? | Yes |
| Impact | The software remains in its infancy, but with over 6000 downloads (pyxem) at time of writing it seems very likely the packages will soon find users beyond its developers and their collaborators. |
| URL | https://github.com/pyxem/pyxem |