Mapping Techniques for Electron Tomography

Electron tomography has established itself firmly as a key technique in materials science for the study of structures in 3D at nanometre resolution. Focus has now shifted to developing 3D Mapping Techniques such as 3D strain mapping and spectroscopic mapping. These methods take multidimensional data from the sample, including both position, topography, and crystallographic information. However, due to limitations on the number of rotational axes available in a transmission electron microscope (TEM), full 3D data cannot be extracted without the application of known parameters or properties. This project aims to develop these techniques through a combination of sample analysis and computational methods. We will explore how this new form of microscopy will allow key microstructural information to be elucidated not just from crystalline materials but also from glassy materials and materials that are defective at the nanoscale with a view to better understanding the nature of crystal disorder at a fundamental level.