XRF Condition Monitoring of Oil Lubricated Machines

Lead Research Organisation: University of Sussex
Department Name: Sch of Engineering and Informatics

Abstract

The technology (called LCM) to be developed in this project uses X-ray fluorescence spectroscopy (XRF) to measure the elemental composition and abundances of microscopic tribological debris caught in machine oil filters. It also measures the composition of the lubricant which also changes with wear. These data can be used to predict impending failure, target preventative maintenance, diagnose faults, and ensure optimum machine operation. LCM can be used on any oil lubricated machine with an oil filter.

This project will build a fully functional demonstrator version of LCM, prove that it can operate in situ in real time on real running machinery, and prepare to bring it to market.

Predicting impending failure and providing early warning of oil wear and machine wear enables operators to avoid downtime by targeting preventative maintenance. Optimum operation and preventing failure can be the difference between profit and loss. In safety critical systems detecting impending failures can save lives. As such, operators dedicate much time, money, and effort to condition monitoring.

LCM is a novel system invented in the UK.

Publications

10 25 50
publication icon
Lioliou G (2022) Electron-hole pair creation and conversion efficiency in radioisotope microbatteries. in Applied radiation and isotopes : including data, instrumentation and methods for use in agriculture, industry and medicine

publication icon
Lioliou G (2022) Mo/4H-SiC Schottky diodes for room temperature X-ray and ? -ray spectroscopy in Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

publication icon
Lioliou G (2021) Repurposing a low-cost commercial Si photodiode as a detector for X-ray and ? -ray spectroscopy at temperatures up to 80 °C in Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

publication icon
Lioliou G (2021) The response of thick (10 ยต m) AlInP x-ray and ?-ray detectors at up to 88 keV in Journal of Applied Physics

publication icon
Lioliou G (2021) X-ray and ? -ray spectroscopy using a 2 × 2 GaAs p + -i-n + diode array in Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

 
Title X-RAY AND GAMMA-RAY PHOTODIODE 
Description A photodiode for use in detecting X-rays and/or gamma rays is disclosed. The photodiode comprises In Ga P arranged and configured to absorb X-rays and/or gamma- rays incident on the photodiode and generate charge-carriers in response thereto. The detector may be provided in an X-ray or gamma-ray photon counting spectrometer. 
IP Reference CA3054760 
Protection Patent application published
Year Protection Granted 2018
Licensed No
Impact Patent applied for: Saudi Arabian Patent Application No. 519402563 Indian Patent Application No. 201917034640 Russian Patent Application No. 2019130429 Canada Patent Application No. 3054760 United States Patent Application No. 16/489425 European Patent Application No. 18709732.4 Chinese Patent Application (in process, pending translation; number to be provided in due course)
 
Title X-RAY AND GAMMA-RAY PHOTODIODE 
Description A photodiode for use in detecting X-rays and/or gamma rays is disclosed. The photodiode comprises In Ga P arranged and configured to absorb X-rays and/or gamma- rays incident on the photodiode and generate charge-carriers in response thereto. The detector may be provided in an X-ray or gamma-ray photon counting spectrometer. 
IP Reference WO2018158569 
Protection Patent application published
Year Protection Granted 2018
Licensed No
Impact Patent applications applied for: Saudi Arabian Patent Application No. 519402563 Indian Patent Application No. 201917034640 Russian Patent Application No. 2019130429 Canada Patent Application No. 3054760 United States Patent Application No. 16/489425 European Patent Application No. 18709732.4 Chinese Patent Application (in process, pending translation; number to be provided in due course)
 
Title X-RAY AND GAMMA-RAY PHOTODIODE 
Description X-ray and gamma-ray photodiode 
IP Reference EP3589983 
Protection Patent application published
Year Protection Granted 2020
Licensed No
Impact Patents applied for: Saudi Arabian Patent Application No. 519402563 Indian Patent Application No. 201917034640 Russian Patent Application No. 2019130429 Canada Patent Application No. 3054760 United States Patent Application No. 16/489425 European Patent Application No. 18709732.4 Chinese Patent Application (in process, pending translation; number to be provided in due course)
 
Title X-Ray and Gamma-Ray Photodiode 
Description A photodiode for use in detecting X-rays and/or gamma rays is disclosed. The photodiode comprises InGaP arranged and configured to absorb X-rays and/or gamma-rays incident on the photodiode and generate charge-carriers in response thereto. The detector may be provided in an X-ray or gamma-ray photon counting spectrometer. 
IP Reference US2020012001 
Protection Patent application published
Year Protection Granted 2020
Licensed No
Impact Other patents applied for Saudi Arabian Patent Application No. 519402563 Indian Patent Application No. 201917034640 Russian Patent Application No. 2019130429 Canada Patent Application No. 3054760 United States Patent Application No. 16/489425 European Patent Application No. 18709732.4 Chinese Patent Application (in process, pending translation; number to be provided in due course)