Atom probe tomography assessment of the impact of electron beam exposure on In x Ga 1-x N/GaN quantum wells (2011)

First Author: Bennett S

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1063/1.3610468

Publication URI: http://dx.doi.org/10.1063/1.3610468

Type: Journal Article/Review

Parent Publication: Applied Physics Letters

Issue: 2