High resolution transmission electron microscopy and three-dimensional atom probe microscopy as complementary techniques for the high spatial resolution analysis of GaN based quantum well systems (2013)

First Author: Oliver R


No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1179/174328408X270301

Publication URI: http://dx.doi.org/10.1179/174328408X270301

Type: Journal Article/Review

Parent Publication: Materials Science and Technology

Issue: 6