Measuring dislocation densities in nonpolar a -plane GaN films using atomic force microscopy (2010)

First Author: Moram M

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1088/0022-3727/43/5/055303

Publication URI: http://dx.doi.org/10.1088/0022-3727/43/5/055303

Type: Journal Article/Review

Parent Publication: Journal of Physics D: Applied Physics

Issue: 5