Accurate calibration for the quantification of the Al content in AlGaN epitaxial layers by energy-dispersive X-ray spectroscopy in a Transmission Electron Microscope (2011)
Attributed to:
Nitrides for the 21st century
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1088/1742-6596/326/1/012028
Publication URI: http://dx.doi.org/10.1088/1742-6596/326/1/012028
Type: Journal Article/Review
Parent Publication: Journal of Physics: Conference Series