Alloy content determination of fully strained and partially relaxed semi-polar group III-nitrides by x-ray diffraction (2013)
Attributed to:
Study of semi-polar and non-polar nitride based structures for opto-electronic device applications
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1063/1.4817422
Publication URI: http://dx.doi.org/10.1063/1.4817422
Type: Journal Article/Review
Parent Publication: Journal of Applied Physics
Issue: 5