Nano-scale mapping of lattice strain and orientation inside carbon core SiC fibres by synchrotron X-ray diffraction (2014)

First Author: Baimpas N
Attributed to:  Multi-disciplinary Centre for In-situ Processing Studies (CIPS) funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1016/j.carbon.2014.07.045

Publication URI: http://dx.doi.org/10.1016/j.carbon.2014.07.045

Type: Journal Article/Review

Parent Publication: Carbon