A review of recent in situ deformation studies using synchrotron X-ray (Micro) beams (2012)

First Author: Korsunsky A.M.
Attributed to:  Multi-disciplinary Centre for In-situ Processing Studies (CIPS) funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Type: Journal Article/Review

Volume: 4

Parent Publication: Micro and Nanosystems

Issue: 2