A Non-raster Scanning Approach in Atomic Force Microscopy Using a Combined Contour Prediction Algorithm (2014)

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.3182/20140824-6-ZA-1003.01683

Publication URI: http://dx.doi.org/10.3182/20140824-6-ZA-1003.01683

Type: Journal Article/Review

Parent Publication: IFAC Proceedings Volumes

Issue: 3