A Non-raster Scanning Approach in Atomic Force Microscopy Using a Combined Contour Prediction Algorithm (2014)
Attributed to:
Robustness and adaptivity: advanced control and estimation algorithms for the transverse dynamic atomic force microscope
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.3182/20140824-6-za-1003.01683
Publication URI: http://dx.doi.org/10.3182/20140824-6-za-1003.01683
Type: Journal Article/Review
Parent Publication: IFAC Proceedings Volumes
Issue: 3