The effect of oxide overlayers on secondary electron dopant mapping. (2009)

First Author: Dapor M

Attributed to: Quantitative, high resolution two-and-three dimensional dopant mapping in the Scanning Electron Microscope by Secondary Electron Spectro-Micro funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1017/s1431927609090400

PubMed Identifier: 19460180

Publication URI: http://europepmc.org/abstract/MED/19460180

Type: Journal Article/Review

Volume: 15

Parent Publication: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada

Issue: 3

ISSN: 1431-9276