Materials Patterning and Characterisation at the Nanometre Scale Using Focused MeV Ion Beams: Present Achievements and Future Prospects (2009)
Attributed to:
University of Surrey Ion Beam Centre
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.12693/aphyspola.115.467
Publication URI: http://dx.doi.org/10.12693/aphyspola.115.467
Type: Journal Article/Review
Parent Publication: Acta Physica Polonica A
Issue: 2