Chemical characterization of latent fingerprints by matrix-assisted laser desorption ionization, time-of-flight secondary ion mass spectrometry, mega electron volt secondary mass spectrometry, gas chromatography/mass spectrometry, X-ray photoelectron spectroscopy, and attenuated total reflection Fourier transform infrared spectroscopic imaging: an intercomparison. (2012)
Attributed to:
University of Surrey Ion Beam Centre
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1021/ac302441y
PubMed Identifier: 22931387
Publication URI: http://europepmc.org/abstract/MED/22931387
Type: Journal Article/Review
Volume: 84
Parent Publication: Analytical chemistry
Issue: 20
ISSN: 0003-2700