Measurement of the physical and electronic properties of ordered nanoporous alumina using XUV excitation spectroscopy (2009)

First Author: Nasir M
Attributed to:  Semiconductor Research at the Materials-Device Interface funded by EPSRC

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1088/0022-3727/42/19/195404

Publication URI: http://dx.doi.org/10.1088/0022-3727/42/19/195404

Type: Journal Article/Review

Parent Publication: Journal of Physics D: Applied Physics

Issue: 19

ISSN: 0022-3727