Prospect of increasing secondary ion yields in ToF-SIMS using water cluster primary ion beams (2014)

First Author: Sheraz (née Rabbani) S

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1002/sia.5606

Publication URI: http://dx.doi.org/10.1002/sia.5606

Type: Journal Article/Review

Parent Publication: Surface and Interface Analysis

Issue: S1