Prospect of increasing secondary ion yields in ToF-SIMS using water cluster primary ion beams (2014)
Attributed to:
Novel ion beams to enhance ionization in molecular secondary ion mass spectrometry
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1002/sia.5606
Publication URI: http://dx.doi.org/10.1002/sia.5606
Type: Journal Article/Review
Parent Publication: Surface and Interface Analysis
Issue: S1