Influence of Annealing and Bulk Hydrogenation on Lifetime-Limiting Defects in Nitrogen-Doped Floating Zone Silicon (2015)

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/JPHOTOV.2014.2367912

Publication URI: http://dx.doi.org/10.1109/JPHOTOV.2014.2367912

Type: Journal Article/Review

Parent Publication: IEEE Journal of Photovoltaics

Issue: 2