NBTI and leakage aware sleep transistor design for reliable and energy efficient power gating (2015)
Attributed to:
Resilient and Testable Energy-Efficient Digital Hardware
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1109/ets.2015.7138752
Publication URI: http://dx.doi.org/10.1109/ets.2015.7138752
Type: Conference/Paper/Proceeding/Abstract