Using transmission Kikuchi diffraction to study intergranular stress corrosion cracking in type 316 stainless steels. (2015)
Attributed to:
Nanoscale characterisation of nitride semiconductor thin films using EBSD, ECCI, CL and EBIC
funded by
EPSRC
Abstract
No abstract provided
Bibliographic Information
Digital Object Identifier: http://dx.doi.org/10.1016/j.micron.2015.04.011
PubMed Identifier: 25974882
Publication URI: http://europepmc.org/abstract/MED/25974882
Type: Journal Article/Review
Volume: 75
Parent Publication: Micron (Oxford, England : 1993)
ISSN: 0968-4328