Investigating the reliability of SiC MOSFET body diodes using Fourier series modelling (2014)

First Author: Bonyadi R

Abstract

No abstract provided

Bibliographic Information

Digital Object Identifier: http://dx.doi.org/10.1109/ECCE.2014.6953427

Publication URI: http://dx.doi.org/10.1109/ECCE.2014.6953427

Type: Conference/Paper/Proceeding/Abstract